Intra-class variation representation for on-line signature verification using wavelet and fractal analysis

Intra-class variation representation for on-line signature verification using wavelet and fractal analysis

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Bibliographic Details
Main Authors: Lee, Hung Liew, Beng, Yong Lee, Yin, Chai Wang
Format: Article
Language:English
Published: IEEE 2018
Subjects:
T Technology (General)
Online Access:http://ir.unimas.my/id/eprint/26531/1/Intra-class%20variation%20representation%20for%20on-line%20signature%20verification%20using%20wavelet%20and%20fractal%20analysis%20%28abstract%29.pdf
http://ir.unimas.my/id/eprint/26531/
https://ieeexplore.ieee.org/document/8270405
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Institution: Universiti Malaysia Sarawak
Language: English

Internet

http://ir.unimas.my/id/eprint/26531/1/Intra-class%20variation%20representation%20for%20on-line%20signature%20verification%20using%20wavelet%20and%20fractal%20analysis%20%28abstract%29.pdf
http://ir.unimas.my/id/eprint/26531/
https://ieeexplore.ieee.org/document/8270405

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