Germanium Oxidation

Scaling down of the planar bulk silicon (Si) metal-oxide-semiconductor (MOS) field effect transistors (FETs) has been confronted its fundamental limit associated with performance, on current, power consumption, and short-channel effects which have the trade-off relationship with each other. Therefo...

Full description

Saved in:
Bibliographic Details
Main Author: Siti Kudnie, Sahari
Format: Book
Language:English
Published: UNIMAS Publisher 2021
Subjects:
Online Access:http://ir.unimas.my/id/eprint/35961/1/Germanium%20Oxidation%206pgs.pdf
http://ir.unimas.my/id/eprint/35961/
https://www.publisher.unimas.my/index.php/online-book-shop
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Universiti Malaysia Sarawak
Language: English
id my.unimas.ir.35961
record_format eprints
spelling my.unimas.ir.359612024-05-31T08:00:39Z http://ir.unimas.my/id/eprint/35961/ Germanium Oxidation Siti Kudnie, Sahari Q Science (General) QE Geology Scaling down of the planar bulk silicon (Si) metal-oxide-semiconductor (MOS) field effect transistors (FETs) has been confronted its fundamental limit associated with performance, on current, power consumption, and short-channel effects which have the trade-off relationship with each other. Therefore, device structures and materials with high carrier mobility are needed for further continues enhancement in device performance. Recently, germanium (Ge) channel has attracted much of the attention for the development of MOSFETs due to the higher carriers’ mobility than Si. However, the precise control of the Ge surface and oxide/Ge interface is the most critical issues for the development of Ge-channel MOSFETs. The quality at the interface between the Ge channel and gate dielectric degrades with increasing native oxide thickness. Understanding the native oxidation is required to provide a good passivation on Ge surfaces. GeO2 can be useful; however, the basic understanding of Ge thermal oxidation is needed. Because of the rapid progress of Germanium fabrication, the first edition of Germanium oxidation clearly needed as a revision. From the native oxidation to the thermal oxidation, the reader is presented with all the series of experiment results. In addition, many broader topics such as overview of Germanium oxidation since 1950s are presented. The chapter’s introduction provides a general discussion of the topics and subsequent section presents the detail of native and thermal oxidation of Germanium. The book is intended as revision for the postgraduates and engineers in oxidation process of Germanium; it assumes that the reader has already acquired an introductory understanding the physics and technology of semiconductor devices. UNIMAS Publisher 2021-06-01 Book PeerReviewed text en http://ir.unimas.my/id/eprint/35961/1/Germanium%20Oxidation%206pgs.pdf Siti Kudnie, Sahari (2021) Germanium Oxidation. UNIMAS Publisher, Universiti Malaysia Sarawak, 94300 Kota Samarahan, Sarawak, Malaysia.. ISBN 978-967-2298-46-5 https://www.publisher.unimas.my/index.php/online-book-shop
institution Universiti Malaysia Sarawak
building Centre for Academic Information Services (CAIS)
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Sarawak
content_source UNIMAS Institutional Repository
url_provider http://ir.unimas.my/
language English
topic Q Science (General)
QE Geology
spellingShingle Q Science (General)
QE Geology
Siti Kudnie, Sahari
Germanium Oxidation
description Scaling down of the planar bulk silicon (Si) metal-oxide-semiconductor (MOS) field effect transistors (FETs) has been confronted its fundamental limit associated with performance, on current, power consumption, and short-channel effects which have the trade-off relationship with each other. Therefore, device structures and materials with high carrier mobility are needed for further continues enhancement in device performance. Recently, germanium (Ge) channel has attracted much of the attention for the development of MOSFETs due to the higher carriers’ mobility than Si. However, the precise control of the Ge surface and oxide/Ge interface is the most critical issues for the development of Ge-channel MOSFETs. The quality at the interface between the Ge channel and gate dielectric degrades with increasing native oxide thickness. Understanding the native oxidation is required to provide a good passivation on Ge surfaces. GeO2 can be useful; however, the basic understanding of Ge thermal oxidation is needed. Because of the rapid progress of Germanium fabrication, the first edition of Germanium oxidation clearly needed as a revision. From the native oxidation to the thermal oxidation, the reader is presented with all the series of experiment results. In addition, many broader topics such as overview of Germanium oxidation since 1950s are presented. The chapter’s introduction provides a general discussion of the topics and subsequent section presents the detail of native and thermal oxidation of Germanium. The book is intended as revision for the postgraduates and engineers in oxidation process of Germanium; it assumes that the reader has already acquired an introductory understanding the physics and technology of semiconductor devices.
format Book
author Siti Kudnie, Sahari
author_facet Siti Kudnie, Sahari
author_sort Siti Kudnie, Sahari
title Germanium Oxidation
title_short Germanium Oxidation
title_full Germanium Oxidation
title_fullStr Germanium Oxidation
title_full_unstemmed Germanium Oxidation
title_sort germanium oxidation
publisher UNIMAS Publisher
publishDate 2021
url http://ir.unimas.my/id/eprint/35961/1/Germanium%20Oxidation%206pgs.pdf
http://ir.unimas.my/id/eprint/35961/
https://www.publisher.unimas.my/index.php/online-book-shop
_version_ 1800730208033046528