Two stages fault detection method based on error, applied in EBM facility

• Main Authors: Ghazali A.B., Hasan A.B.
• Other Authors: 56727852400
• Format: Conference Paper
• Published: American Institute of Physics Inc. 2023
• Institution: Universiti Tenaga Nasional

Data driven technique is a well-known method in fault detection and it is suitable for large industrial systems. In this article, this technique is applied in an electron beam (EB) facility to assist the technology available in that facility so that the number and cost of equipment/component failure...