Interplay between variable direct current sputtering deposition process parameters and properties of ZnO:Ga thin films

Conductive films; Gallium compounds; Grain growth; II-VI semiconductors; Infrared spectroscopy; Oxide films; Sputtering; Zinc oxide; Gallium doped zinc oxides; Optoelectronic properties; Spatial variations; Sputtering deposition; Transparent conductive oxides; Thin films

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Bibliographic Details
Main Authors: Ferdaous M.T., Shahahmadi S.A., Sapeli M.M.I., Chelvanathan P., Akhtaruzzaman M., Tiong S.K., Amin N.
Other Authors: 55567613100
Format: Article
Published: Elsevier B.V. 2023
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Institution: Universiti Tenaga Nasional
Description
Summary:Conductive films; Gallium compounds; Grain growth; II-VI semiconductors; Infrared spectroscopy; Oxide films; Sputtering; Zinc oxide; Gallium doped zinc oxides; Optoelectronic properties; Spatial variations; Sputtering deposition; Transparent conductive oxides; Thin films