A multidrop optical network testbed for EPON platform

In an Ethernet Passive Optical Network (EPON) environment, the Optical Line Terminal (OLT) and Optical Network Unit (ONU) are the main end components that are required for the transfer of data. For the data transmission process, a communication protocol, i.e Multi-Point Control Protocol (MPCP) is re...

Full description

Saved in:
Bibliographic Details
Main Authors: Majid M.S.A., Din N.Md., Jamaludin Md.Z., Al-Mansoori M.H., Mustafa I.S., Radzi N.A.M., Sadon S.Kh.
Other Authors: 37018353800
Format: Conference paper
Published: 2023
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Universiti Tenaga Nasional
id my.uniten.dspace-30635
record_format dspace
spelling my.uniten.dspace-306352023-12-29T15:50:37Z A multidrop optical network testbed for EPON platform Majid M.S.A. Din N.Md. Jamaludin Md.Z. Al-Mansoori M.H. Mustafa I.S. Radzi N.A.M. Sadon S.Kh. 37018353800 9335429400 57216839721 6505891021 26967833900 57218936786 35590723900 Communication Engineering research Ethernet Fiber optic networks Innovation Microcontrollers Optical communication Telecommunication networks Test facilities Testbeds Communication protocols Data transmission Ethernet passive optical networks Multipoint control protocols Optical line terminals Optical network test-bed Optical network units PIC microcontrollers Passive networks In an Ethernet Passive Optical Network (EPON) environment, the Optical Line Terminal (OLT) and Optical Network Unit (ONU) are the main end components that are required for the transfer of data. For the data transmission process, a communication protocol, i.e Multi-Point Control Protocol (MPCP) is required to avoid collision of the data that travel between the OLT and ONU This paper describes an effort in developing an EPON environment with MPCP for the OLT and ONU communications. A multidrop optical network testbed was developed on a platform intergrated with PIC microcontrollers. Although the microcontrollers have some limitations, the testbed can be used to test out protocols and algorithms for the EPON environment. �2010 IEEE. Final 2023-12-29T07:50:37Z 2023-12-29T07:50:37Z 2010 Conference paper 10.1109/SCORED.2010.5703975 2-s2.0-79951966027 https://www.scopus.com/inward/record.uri?eid=2-s2.0-79951966027&doi=10.1109%2fSCORED.2010.5703975&partnerID=40&md5=8f4243b5aa9822ea1622bcfef9caf120 https://irepository.uniten.edu.my/handle/123456789/30635 5703975 77 80 Scopus
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
topic Communication
Engineering research
Ethernet
Fiber optic networks
Innovation
Microcontrollers
Optical communication
Telecommunication networks
Test facilities
Testbeds
Communication protocols
Data transmission
Ethernet passive optical networks
Multipoint control protocols
Optical line terminals
Optical network test-bed
Optical network units
PIC microcontrollers
Passive networks
spellingShingle Communication
Engineering research
Ethernet
Fiber optic networks
Innovation
Microcontrollers
Optical communication
Telecommunication networks
Test facilities
Testbeds
Communication protocols
Data transmission
Ethernet passive optical networks
Multipoint control protocols
Optical line terminals
Optical network test-bed
Optical network units
PIC microcontrollers
Passive networks
Majid M.S.A.
Din N.Md.
Jamaludin Md.Z.
Al-Mansoori M.H.
Mustafa I.S.
Radzi N.A.M.
Sadon S.Kh.
A multidrop optical network testbed for EPON platform
description In an Ethernet Passive Optical Network (EPON) environment, the Optical Line Terminal (OLT) and Optical Network Unit (ONU) are the main end components that are required for the transfer of data. For the data transmission process, a communication protocol, i.e Multi-Point Control Protocol (MPCP) is required to avoid collision of the data that travel between the OLT and ONU This paper describes an effort in developing an EPON environment with MPCP for the OLT and ONU communications. A multidrop optical network testbed was developed on a platform intergrated with PIC microcontrollers. Although the microcontrollers have some limitations, the testbed can be used to test out protocols and algorithms for the EPON environment. �2010 IEEE.
author2 37018353800
author_facet 37018353800
Majid M.S.A.
Din N.Md.
Jamaludin Md.Z.
Al-Mansoori M.H.
Mustafa I.S.
Radzi N.A.M.
Sadon S.Kh.
format Conference paper
author Majid M.S.A.
Din N.Md.
Jamaludin Md.Z.
Al-Mansoori M.H.
Mustafa I.S.
Radzi N.A.M.
Sadon S.Kh.
author_sort Majid M.S.A.
title A multidrop optical network testbed for EPON platform
title_short A multidrop optical network testbed for EPON platform
title_full A multidrop optical network testbed for EPON platform
title_fullStr A multidrop optical network testbed for EPON platform
title_full_unstemmed A multidrop optical network testbed for EPON platform
title_sort multidrop optical network testbed for epon platform
publishDate 2023
_version_ 1806425961507323904