LFSR based fast seed selection technique reducing test time of I DDQ testing

• Main Authors: Islam S.Z., Jidin R.B., Ali M.A.M.
• Other Authors: 55432804400
• Format: Conference paper
• Published: 2023
• Subjects: Bridging fault; I_DDQ; LFSR; Combinatorial circuits; Industrial electronics; Shift registers; Benchmark circuit; Bit flipping; CMOS circuits; Combinational circuits; IDDQ testing; Linear feedback shift registers; Logic testing; Seed selection; Switching activities; Test time; Testing time; Delay circuits
• Institution: Universiti Tenaga Nasional

This paper proposed IDDQ testing of combinational circuit using Linear Feedback Shift Register (LFSR) based fast seed selection technique. Although IDDQ testing is known to be effective to detect faults in CMOS circuit, test time of IDDQ testing is larger than that of logic testing. To reduce test t...