Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz
Complex permittivity measurement has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 300 kHz to 50 MHz. The material under test (MUT) is a flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters....
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my.uniten.dspace-56992017-12-15T01:40:26Z Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz Raymond, W.J.K. Chakrabarty, C.K. Hock, G.C. Ghani, A.B. Complex permittivity measurement has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 300 kHz to 50 MHz. The material under test (MUT) is a flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%. © 2013 Published by Elsevier Ltd. 2017-12-08T06:45:30Z 2017-12-08T06:45:30Z 2013 Article 10.1016/j.measurement.2013.06.039 en_US Measurement: Journal of the International Measurement Confederation Volume 46, Issue 10, 2013, Pages 3796-3801 |
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Complex permittivity measurement has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 300 kHz to 50 MHz. The material under test (MUT) is a flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%. © 2013 Published by Elsevier Ltd. |
| format |
Article |
| author |
Raymond, W.J.K. Chakrabarty, C.K. Hock, G.C. Ghani, A.B. |
| spellingShingle |
Raymond, W.J.K. Chakrabarty, C.K. Hock, G.C. Ghani, A.B. Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz |
| author_facet |
Raymond, W.J.K. Chakrabarty, C.K. Hock, G.C. Ghani, A.B. |
| author_sort |
Raymond, W.J.K. |
| title |
Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz |
| title_short |
Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz |
| title_full |
Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz |
| title_fullStr |
Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz |
| title_full_unstemmed |
Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz |
| title_sort |
complex permittivity measurement using capacitance method from 300 khz to 50 mhz |
| publishDate |
2017 |
| _version_ |
1644493753707134976 |