Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material
This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer...
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my.uniten.dspace-57432017-12-14T01:46:04Z Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material Hock, G.C. Chakrabarty, C.K. Badjian, M.H. Devkumar, S. Emilliano This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language. © 2008 IEEE. 2017-12-08T06:45:49Z 2017-12-08T06:45:49Z 2008 Conference Paper 10.1109/RFM.2008.4897416 en_US 2008 IEEE International RF and Microwave Conference, RFM 2008 2008, Article number 4897416, Pages 167-170 |
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This paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView™ graphical programming language. © 2008 IEEE. |
format |
Conference Paper |
author |
Hock, G.C. Chakrabarty, C.K. Badjian, M.H. Devkumar, S. Emilliano |
spellingShingle |
Hock, G.C. Chakrabarty, C.K. Badjian, M.H. Devkumar, S. Emilliano Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
author_facet |
Hock, G.C. Chakrabarty, C.K. Badjian, M.H. Devkumar, S. Emilliano |
author_sort |
Hock, G.C. |
title |
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
title_short |
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
title_full |
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
title_fullStr |
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
title_full_unstemmed |
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
title_sort |
super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material |
publishDate |
2017 |
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1644493764473913344 |