Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software

A system of lead-free silica borotellurite glasses containing bismuth oxide was fabricated in accordance with conventional melt-quenching procedure. XRD analysis, UV-Vis spectroscopy and Archimedes principle were employed to unveil the structural, and optical properties. User friendly Phy-X/PSD soft...

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Main Authors: Geidam, I. G., Matori, K. A., M. K., Halimah, Chan, K. T., Muhammad, F. D., Ishak, M., Umar, S. A.
Format: Article
Published: Elsevier 2022
Online Access:http://psasir.upm.edu.my/id/eprint/102431/
https://www.sciencedirect.com/science/article/pii/S2352492822003403?via%3Dihub
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spelling my.upm.eprints.1024312023-05-18T03:08:25Z http://psasir.upm.edu.my/id/eprint/102431/ Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software Geidam, I. G. Matori, K. A. M. K., Halimah Chan, K. T. Muhammad, F. D. Ishak, M. Umar, S. A. A system of lead-free silica borotellurite glasses containing bismuth oxide was fabricated in accordance with conventional melt-quenching procedure. XRD analysis, UV-Vis spectroscopy and Archimedes principle were employed to unveil the structural, and optical properties. User friendly Phy-X/PSD software was used to ascertain the theoretically radiation shielding features of the glasses. The existence of a diffuse hump in the XRD profile revealed the glasses amorphous characteristic. The molar volume and density values showed nonlinear variation with respect to the increase in mol% of Bi2O3. Optical bandgap, index of refraction, oxide ion polarizability (based on index of refraction and bandgap), optical dielectric constant, and third order susceptibility were computed. Various shielding related parameters, specifically, mass attenuation coefficient (MAC), linear attenuation coefficient (LAC), effective atomic number (Zeff), effective electron density (Neff), mean free path (MFP), half value layer (HVL) and tenth value layer (TVL) were evaluated in the gamma photon energy range between 0.015 MeV and 15 MeV. The results revealed that BSBT5 glass containing higher Bi2O3 mol% exhibits maximum values of density, MAC, LAC, Zeff, Neff and minimum MFP, HVL and TVL. This indicates enhancement in the glass shielding properties with the addition of bismuth and the superiority of BSBT5 glass for radiation shielding applications compared to other studied glasses. Elsevier 2022 Article PeerReviewed Geidam, I. G. and Matori, K. A. and M. K., Halimah and Chan, K. T. and Muhammad, F. D. and Ishak, M. and Umar, S. A. (2022) Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software. Materials Today Communications, 31. art. no. 103472. pp. 1-9. ISSN 2352-4928 https://www.sciencedirect.com/science/article/pii/S2352492822003403?via%3Dihub 10.1016/j.mtcomm.2022.103472
institution Universiti Putra Malaysia
building UPM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Putra Malaysia
content_source UPM Institutional Repository
url_provider http://psasir.upm.edu.my/
description A system of lead-free silica borotellurite glasses containing bismuth oxide was fabricated in accordance with conventional melt-quenching procedure. XRD analysis, UV-Vis spectroscopy and Archimedes principle were employed to unveil the structural, and optical properties. User friendly Phy-X/PSD software was used to ascertain the theoretically radiation shielding features of the glasses. The existence of a diffuse hump in the XRD profile revealed the glasses amorphous characteristic. The molar volume and density values showed nonlinear variation with respect to the increase in mol% of Bi2O3. Optical bandgap, index of refraction, oxide ion polarizability (based on index of refraction and bandgap), optical dielectric constant, and third order susceptibility were computed. Various shielding related parameters, specifically, mass attenuation coefficient (MAC), linear attenuation coefficient (LAC), effective atomic number (Zeff), effective electron density (Neff), mean free path (MFP), half value layer (HVL) and tenth value layer (TVL) were evaluated in the gamma photon energy range between 0.015 MeV and 15 MeV. The results revealed that BSBT5 glass containing higher Bi2O3 mol% exhibits maximum values of density, MAC, LAC, Zeff, Neff and minimum MFP, HVL and TVL. This indicates enhancement in the glass shielding properties with the addition of bismuth and the superiority of BSBT5 glass for radiation shielding applications compared to other studied glasses.
format Article
author Geidam, I. G.
Matori, K. A.
M. K., Halimah
Chan, K. T.
Muhammad, F. D.
Ishak, M.
Umar, S. A.
spellingShingle Geidam, I. G.
Matori, K. A.
M. K., Halimah
Chan, K. T.
Muhammad, F. D.
Ishak, M.
Umar, S. A.
Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software
author_facet Geidam, I. G.
Matori, K. A.
M. K., Halimah
Chan, K. T.
Muhammad, F. D.
Ishak, M.
Umar, S. A.
author_sort Geidam, I. G.
title Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software
title_short Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software
title_full Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software
title_fullStr Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software
title_full_unstemmed Oxide ion polarizabilities and gamma radiation shielding features of TeO2-B2O3-SiO2 glasses containing Bi2O3 using Phy-X/PSD software
title_sort oxide ion polarizabilities and gamma radiation shielding features of teo2-b2o3-sio2 glasses containing bi2o3 using phy-x/psd software
publisher Elsevier
publishDate 2022
url http://psasir.upm.edu.my/id/eprint/102431/
https://www.sciencedirect.com/science/article/pii/S2352492822003403?via%3Dihub
_version_ 1768009455876702208