Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate.
NiFe film was pulse electrodeposited on conductive Cu substrate under galvanostatic mode in the presence of an ultrasonic field. The NiFe film electrodeposited was subjected to structural and surface analyses by X-ray diffraction, energy dispersive X-ray spectroscopy, surface profiling and scanning...
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2009
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my.upm.eprints.144242015-09-02T02:21:09Z http://psasir.upm.edu.my/id/eprint/14424/ Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. Balachandran, R. Yow, H. K. Ong, Boon Hoong Manickam, R. Saaminathan, V. Tan, Kar Ban NiFe film was pulse electrodeposited on conductive Cu substrate under galvanostatic mode in the presence of an ultrasonic field. The NiFe film electrodeposited was subjected to structural and surface analyses by X-ray diffraction, energy dispersive X-ray spectroscopy, surface profiling and scanning electron microscopy, respectively. The results show that the ultrasonic field has significantly improved the surface roughness, reduced the spherical grain size in the range from 490–575 nm to 90–150 nm, and increased the Ni content from 76.08% to 79.74% in the NiFe film electrodeposited. Elsevier 2009-07-29 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/14424/1/Effects%20of%20ultrasonic%20field%20in%20pulse%20electrodeposition%20of%20NiFe%20film%20on%20Cu%20substrate.pdf Balachandran, R. and Yow, H. K. and Ong, Boon Hoong and Manickam, R. and Saaminathan, V. and Tan, Kar Ban (2009) Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. Journal of Alloys and Compounds, 481 (1-2). pp. 336-339. ISSN 0925-8388; ESSN: 1873-4669 10.1016/j.jallcom.2009.02.129 English |
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NiFe film was pulse electrodeposited on conductive Cu substrate under galvanostatic mode in the presence of an ultrasonic field. The NiFe film electrodeposited was subjected to structural and surface analyses by X-ray diffraction, energy dispersive X-ray spectroscopy, surface profiling and scanning electron microscopy, respectively. The results show that the ultrasonic field has significantly improved the surface roughness, reduced the spherical grain size in the range from 490–575 nm to 90–150 nm, and increased the Ni content from 76.08% to 79.74% in the NiFe film electrodeposited. |
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Article |
author |
Balachandran, R. Yow, H. K. Ong, Boon Hoong Manickam, R. Saaminathan, V. Tan, Kar Ban |
spellingShingle |
Balachandran, R. Yow, H. K. Ong, Boon Hoong Manickam, R. Saaminathan, V. Tan, Kar Ban Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. |
author_facet |
Balachandran, R. Yow, H. K. Ong, Boon Hoong Manickam, R. Saaminathan, V. Tan, Kar Ban |
author_sort |
Balachandran, R. |
title |
Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. |
title_short |
Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. |
title_full |
Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. |
title_fullStr |
Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. |
title_full_unstemmed |
Effects of ultrasonic field in pulse electrodeposition of NiFe film on Cu substrate. |
title_sort |
effects of ultrasonic field in pulse electrodeposition of nife film on cu substrate. |
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Elsevier |
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2009 |
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http://psasir.upm.edu.my/id/eprint/14424/1/Effects%20of%20ultrasonic%20field%20in%20pulse%20electrodeposition%20of%20NiFe%20film%20on%20Cu%20substrate.pdf http://psasir.upm.edu.my/id/eprint/14424/ |
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