Metrology at nanoscale: thermal wave probe made it simple

A major hurdle facing nanotechnology implementation is in how samples of nano-scale dimensions can be probed. Parts of the problems include sample mounting, making contact with the sample; the possibility that the act of measuring alters the sample, repeatability and accuracy of measurement and refe...

Full description

Saved in:
Bibliographic Details
Main Author: Abd. Moksin, Mohd Maarof
Format: Inaugural Lecture
Language:English
English
Published: Universiti Putra Malaysia Press 2008
Online Access:http://psasir.upm.edu.my/id/eprint/18217/1/cover%20Inaugural%20Dr.Maarof.pdf
http://psasir.upm.edu.my/id/eprint/18217/6/PROF.%20MAAROF%20INAUGURAL.pdf
http://psasir.upm.edu.my/id/eprint/18217/
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Universiti Putra Malaysia
Language: English
English
Be the first to leave a comment!
You must be logged in first