Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors

• Main Authors: You, Kok Yeow, Abbas, Zulkifly, Abd Malek, Mohd Fareq, Cheng, Ee Meng
• Format: Article
• Language: English
• Published: De Gruyter Open 2014
• Online Access: http://psasir.upm.edu.my/id/eprint/34659/1/Non-destructive%20dielectric%20measurements%20and%20calibration%20for%20thin%20materials%20using%20waveguide-coaxial%20adaptors.pdf; http://psasir.upm.edu.my/id/eprint/34659/; http://www.degruyter.com/view/j/msr.2014.14.issue-1/msr-2014-0003/msr-2014-0003.xml
• Institution: Universiti Putra Malaysia

This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-reflect-line (TRL) method. In this study, analogous relationships between the results of OSL calibration and TL calibration were identified. In the OSL calibration method, the theoretical, open-standard values are calculated from quasi-static integral models. The proposed TL calibration procedure is a simple, rapid, broadband approach, and its results were validated by using the OSL calibration method and by comparing the results with the calculated integral admittance. The quasi-static integral models were used to convert the measured reflection coefficients to relative permittivities for the infinite samples and the thin, finite samples.