HRTEM analysis of magnetron sputtered Ni4Al thin films

HRTEM analysis of magnetron sputtered Ni4Al thin films

The nanostructural characteristics of direct-current magnetron sputter-deposited Ni4Al alloy films were studied during in situ isothermal annealing in a transmission electron microscope (TEM). An expansion of the lattice by nearly 5% was observed for the synthesized films in their low-thickness and...

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Main Authors: Thangaraj, Joseph Sahaya Anand, Mohd Abid, Mohd Asyadi 'Azam, Subramonian, Sivarao, Buang, Zolkepli, K.M.Rajan, Rajes, Mat Yusoff, Nurul Hazliza, Abdul Aziz, Mohd Zaidan, Chua, Kok Yau
Format: Article
Language:English
Published: Trans Tech Publications 2015
Online Access:http://eprints.utem.edu.my/id/eprint/14327/1/41_AMM_761.pdf
http://eprints.utem.edu.my/id/eprint/14327/
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Institution: Universiti Teknikal Malaysia Melaka
Language: English

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http://eprints.utem.edu.my/id/eprint/14327/1/41_AMM_761.pdf
http://eprints.utem.edu.my/id/eprint/14327/

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