A device, a method and a system for detecting properties of a material
A device (100) for detecting properties of a material comprising a substrate (102), a pair of feed-lines (104) and a pair of concentric annular rings. The pair of concentric annular rings includes an inner ring (106) with a centered- connecting joint and an outer ring (108) wrappedaround the inner...
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Main Authors: | , , , , |
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Format: | Patent |
Language: | English |
Published: |
2016
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Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/17770/1/A%20Device%2C%20A%20Method%20And%20A%20System%20For%20Detecting%20Properties%20Of%20A%20Material.pdf http://eprints.utem.edu.my/id/eprint/17770/ |
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Institution: | Universiti Teknikal Malaysia Melaka |
Language: | English |
Summary: | A device (100) for detecting properties of a material comprising a substrate (102), a pair of feed-lines (104) and
a pair of concentric annular rings. The pair of concentric annular rings includes an inner ring (106) with a
centered- connecting joint and an outer ring (108) wrappedaround the inner ring (106). The inner ring (106) is
configured to have a first plurality of splits
(110) at opposite points on the inner ring (106). The outer ring (108) is configured to have asecond plurality of
splits (112) formed at different symmetric points on the outer ring (108) from the opposite points on the inner
ring (106). Also, the device (100) is excited to generatean electric field and a magnetic field. A method (200) and
a system (300) for detecting properties of the material are also provided. |
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