MBIST implementation and evaluation in FPGA based on low-complexity March algorithms

March algorithms are widely used in Memory Built-In Self-Test (MBIST) on-chip memory testing, providing linear test complexities that reduce the test time and cost. However, studies show that March algorithms with complexities lower than 18N have poor coverages of faults that have emerged with the a...

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Bibliographic Details
Main Authors: Jidin, Aiman Zakwan, Mispan, Mohd Syafiq, Hussin, Razaidi, Weng, Fook Lee
Format: Article
Language:English
Published: World Scientific 2024
Online Access:http://eprints.utem.edu.my/id/eprint/27483/2/0230307052024112452804.PDF
http://eprints.utem.edu.my/id/eprint/27483/
https://www.worldscientific.com/doi/epdf/10.1142/S0218126624501524
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Institution: Universiti Teknikal Malaysia Melaka
Language: English