Electrosynthesized NiSe2 thin films and their characterization studies

• Main Authors: T., Joseph Sahaya Anand, Abdul Aziz, Mohd Zaidan Bin, K.M.Rajan, Rajes
• Format: Conference or Workshop Item
• Language: English
• Published: 2012
• Subjects: TJ Mechanical engineering and machinery
• Online Access: http://eprints.utem.edu.my/id/eprint/6956/1/Electrosynthesized_NiSe2_thin_films.pdf; http://eprints.utem.edu.my/id/eprint/6956/; http://www.mrs.org.sg/icyram2012/public.asp?page=home.asp
• Institution: Universiti Teknikal Malaysia Melaka

Nickel chalcogenides, specifically nickel selenide, NiSe2 thin films have been successfully deposited onto indium-tin-oxide (ITO) coated glass substrates and stainless steel substrates by electrodeposition technique. The effects of the deposition time on the growth, structural and optical properties of the films were then studied. X-ray diffraction (XRD) patterns have confirmed the polycrystalline NiSe2 phase formation. The results show that the intensity of XRD peaks for these materials increases with the increase of deposition time. UV -Vis spectrophotometric measurement revealed that the optical band gap values of the thin films decreased with the increase of deposition time and lie in the range of semiconductor properties. Surface morphology studies by scanning electron microscopy showed uniform and continuous thin film with layered structure surface.