Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing

Pseudorandom testing is incapable of utilizing the success rate of preceding test patterns while generating subsequent test patterns. Many redundant test patterns have been generated that increase the test length without any significant increase in the fault coverage. An extension to pseudorandom te...

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Bibliographic Details
Main Author: Alamgir, Arbab
Format: Thesis
Language:English
Published: 2022
Subjects:
Online Access:http://eprints.utm.my/id/eprint/101819/1/ArbabAlamgirPSKE2022.pdf
http://eprints.utm.my/id/eprint/101819/
http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:149118
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Institution: Universiti Teknologi Malaysia
Language: English