Temperature and strain-rate dependent damage-based models for lead-free solder interconnects

Microelectronic packages with ball grid array (BGA) solder interconnects are subjected to thermomechanical load cycles during fabrication and throughout service life. The lead-free solder joints of BGA respond to both temperature and strain-rate depends on the exposed temperature cycles. Consequentl...

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Bibliographic Details
Main Author: Mad Asasaari, Siti Faizah
Format: Thesis
Language:English
Published: 2021
Subjects:
Online Access:http://eprints.utm.my/id/eprint/102081/1/SitiFaizahMadPSKM2021.pdf
http://eprints.utm.my/id/eprint/102081/
http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:147314
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Institution: Universiti Teknologi Malaysia
Language: English