Characterization and model development of complementary metal oxide semiconductor floating gate defect

Characterization and model development of complementary metal oxide semiconductor floating gate defect

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Bibliographic Details
Main Author: Wong, Yan Chiew
Format: Thesis
Published: 2008
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utm.my/id/eprint/17978/
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Institution: Universiti Teknologi Malaysia
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