Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch

Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the st...

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Main Author: Ismail, Muhamad Amri
Format: Thesis
Published: 2009
Subjects:
Online Access:http://eprints.utm.my/id/eprint/18888/
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Institution: Universiti Teknologi Malaysia
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spelling my.utm.188882013-12-31T03:12:27Z http://eprints.utm.my/id/eprint/18888/ Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch Ismail, Muhamad Amri TK Electrical engineering. Electronics Nuclear engineering Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the student who found commited in disciplinary problem at school. Form four parents of the student were involved in the study to explore their perception upon canning. Questionnaire is the only instrument used to explore the respondents perception. A total number of 94 parents were responded to the questionnaire. The data is analysed by using SPSS (Statistical Package For Social Sciences) Versi 11.5 For Windows. Results showed in terms of frequency, percentage and mean. It is indicated that most of the parents were agreed upon the usage of canning in disciplining their children at school (mean = 3.40; N = 94). The findings are also compared with previous results to evaluate the effectiveness of canning in school. 2009 Thesis NonPeerReviewed Ismail, Muhamad Amri (2009) Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Ismail, Muhamad Amri
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
description Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the student who found commited in disciplinary problem at school. Form four parents of the student were involved in the study to explore their perception upon canning. Questionnaire is the only instrument used to explore the respondents perception. A total number of 94 parents were responded to the questionnaire. The data is analysed by using SPSS (Statistical Package For Social Sciences) Versi 11.5 For Windows. Results showed in terms of frequency, percentage and mean. It is indicated that most of the parents were agreed upon the usage of canning in disciplining their children at school (mean = 3.40; N = 94). The findings are also compared with previous results to evaluate the effectiveness of canning in school.
format Thesis
author Ismail, Muhamad Amri
author_facet Ismail, Muhamad Amri
author_sort Ismail, Muhamad Amri
title Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_short Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_full Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_fullStr Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_full_unstemmed Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
title_sort modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
publishDate 2009
url http://eprints.utm.my/id/eprint/18888/
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