Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch
Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the st...
Saved in:
Main Author: | |
---|---|
Format: | Thesis |
Published: |
2009
|
Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/18888/ |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Universiti Teknologi Malaysia |
id |
my.utm.18888 |
---|---|
record_format |
eprints |
spelling |
my.utm.188882013-12-31T03:12:27Z http://eprints.utm.my/id/eprint/18888/ Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch Ismail, Muhamad Amri TK Electrical engineering. Electronics Nuclear engineering Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the student who found commited in disciplinary problem at school. Form four parents of the student were involved in the study to explore their perception upon canning. Questionnaire is the only instrument used to explore the respondents perception. A total number of 94 parents were responded to the questionnaire. The data is analysed by using SPSS (Statistical Package For Social Sciences) Versi 11.5 For Windows. Results showed in terms of frequency, percentage and mean. It is indicated that most of the parents were agreed upon the usage of canning in disciplining their children at school (mean = 3.40; N = 94). The findings are also compared with previous results to evaluate the effectiveness of canning in school. 2009 Thesis NonPeerReviewed Ismail, Muhamad Amri (2009) Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering. |
institution |
Universiti Teknologi Malaysia |
building |
UTM Library |
collection |
Institutional Repository |
continent |
Asia |
country |
Malaysia |
content_provider |
Universiti Teknologi Malaysia |
content_source |
UTM Institutional Repository |
url_provider |
http://eprints.utm.my/ |
topic |
TK Electrical engineering. Electronics Nuclear engineering |
spellingShingle |
TK Electrical engineering. Electronics Nuclear engineering Ismail, Muhamad Amri Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
description |
Disciplinary management is considered as an ongoing process. Wether it be at home, school or in the society, every member are responsible to the disciplinary development of the student. This study have been conducted in one secondary school in Johor Bahru to investigate the used of canning to the student who found commited in disciplinary problem at school. Form four parents of the student were involved in the study to explore their perception upon canning. Questionnaire is the only instrument used to explore the respondents perception. A total number of 94 parents were responded to the questionnaire. The data is analysed by using SPSS (Statistical Package For Social Sciences) Versi 11.5 For Windows. Results showed in terms of frequency, percentage and mean. It is indicated that most of the parents were agreed upon the usage of canning in disciplining their children at school (mean = 3.40; N = 94). The findings are also compared with previous results to evaluate the effectiveness of canning in school.
|
format |
Thesis |
author |
Ismail, Muhamad Amri |
author_facet |
Ismail, Muhamad Amri |
author_sort |
Ismail, Muhamad Amri |
title |
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
title_short |
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
title_full |
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
title_fullStr |
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
title_full_unstemmed |
Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
title_sort |
modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch |
publishDate |
2009 |
url |
http://eprints.utm.my/id/eprint/18888/ |
_version_ |
1643647013678481408 |