Initial study on optical tomographic instrumentation system based on CMOS area image sensors
This research investigates the use of complementary metal-oxide semiconductor (abbreviated as CMOS) area image sensors in optical tomography system. The system consists of a lighting system, a measurement section and a data acquisition system. Two area image sensors are configured around a square sh...
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Main Authors: | , , , , |
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Format: | Article |
Published: |
International Frequency Sensor Association
2012
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/32836/ http://www.sensorsportal.com/HTML/DIGEST/P_968.htm |
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Institution: | Universiti Teknologi Malaysia |
Summary: | This research investigates the use of complementary metal-oxide semiconductor (abbreviated as CMOS) area image sensors in optical tomography system. The system consists of a lighting system, a measurement section and a data acquisition system. Two area image sensors are configured around a square shaped measurement section for a two projections system. Each area image sensors consists of 1600 ´ 1400 pixels with a pixel size of 2.8 ´ 2.8 micron, hence producing a high resolution system. This paper explains the initial study on activating the CMOS area image sensor model MT9D1C12STC manufactured by Micron Technology. |
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