IC test based on scan cell

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Bibliographic Details
Main Author:	Rahiman, Rosdina
Format:	Thesis
Published:	2001
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utm.my/id/eprint/43231/
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Institution:	Universiti Teknologi Malaysia

id	my.utm.43231
record_format	eprints
spelling	my.utm.432312014-11-02T03:30:00Z http://eprints.utm.my/id/eprint/43231/ IC test based on scan cell Rahiman, Rosdina TK Electrical engineering. Electronics Nuclear engineering 2001 Thesis NonPeerReviewed Rahiman, Rosdina (2001) IC test based on scan cell. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering.
institution	Universiti Teknologi Malaysia
building	UTM Library
collection	Institutional Repository
continent	Asia
country	Malaysia
content_provider	Universiti Teknologi Malaysia
content_source	UTM Institutional Repository
url_provider	http://eprints.utm.my/
topic	TK Electrical engineering. Electronics Nuclear engineering
spellingShingle	TK Electrical engineering. Electronics Nuclear engineering Rahiman, Rosdina IC test based on scan cell
format	Thesis
author	Rahiman, Rosdina
author_facet	Rahiman, Rosdina
author_sort	Rahiman, Rosdina
title	IC test based on scan cell
title_short	IC test based on scan cell
title_full	IC test based on scan cell
title_fullStr	IC test based on scan cell
title_full_unstemmed	IC test based on scan cell
title_sort	ic test based on scan cell
publishDate	2001
url	http://eprints.utm.my/id/eprint/43231/
_version_	1643651129716768768

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