Growth of Ge/Si(100) nanostructures by radio-frequency magnetron sputtering: the role of annealing temperature

Surface morphologies of Ge islands deposited on Si(100) substrates are characterized and their optical properties determined. Samples are prepared by rf magnetron sputtering in a high-vacuum chamber and are annealed at 600°C, 700°C and 800°C for 2 min at nitrogen ambient pressure. Atomic force micro...

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Bibliographic Details
Main Authors: Alireza, S., Ghoshal, S. K., Othaman, Z.
Format: Article
Published: IOP Publishing 2012
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Online Access:http://eprints.utm.my/id/eprint/47040/
http://iopscience.iop.org/article/10.1088/0256-307X/29/4/048101/meta
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Institution: Universiti Teknologi Malaysia