Numerical studies of ion beam in NX2 plasma focus for different applied voltage

Plasma focus device gives simultaneous interaction between magnetic and electric field which results in exhibiting multi-radiation properties. Ion beam radiates from the system is significant for experimenting target material of interest in plasma focus research. Lee code model is used to simulate t...

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Main Authors: Nawi, N. D., Ong, S. T., Ali, J., Chaudhary, K., Bahadoran, M., Daud, S.
Format: Article
Language:English
Published: Penerbit UTM Press 2016
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Online Access:http://eprints.utm.my/id/eprint/70081/1/NinaDianaNawi2016_NumericalStudiesofIonBeamInNx2.pdf
http://eprints.utm.my/id/eprint/70081/
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Institution: Universiti Teknologi Malaysia
Language: English
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spelling my.utm.700812017-11-22T00:45:13Z http://eprints.utm.my/id/eprint/70081/ Numerical studies of ion beam in NX2 plasma focus for different applied voltage Nawi, N. D. Ong, S. T. Ali, J. Chaudhary, K. Bahadoran, M. Daud, S. RM Therapeutics. Pharmacology Plasma focus device gives simultaneous interaction between magnetic and electric field which results in exhibiting multi-radiation properties. Ion beam radiates from the system is significant for experimenting target material of interest in plasma focus research. Lee code model is used to simulate the numerical experiments on NX2-plasma focus device system using different applied voltage in the range 10 to 14 kV. The system is operating in Neon filled at an optimum pressure depending on the applied voltage used in the experiment. Results obtained are analysed and fitted with the experimental results for system validation. Good fitting on the numerical with the experimental results is obtained by incorporating mass shedding effects and current shedding factor. The range of current density obtained is in the range 1.6 × 108 to 7.3×109 Am-2whilst the maximum ion beam energy is estimated to be 156 J. Penerbit UTM Press 2016 Article PeerReviewed application/pdf en http://eprints.utm.my/id/eprint/70081/1/NinaDianaNawi2016_NumericalStudiesofIonBeamInNx2.pdf Nawi, N. D. and Ong, S. T. and Ali, J. and Chaudhary, K. and Bahadoran, M. and Daud, S. (2016) Numerical studies of ion beam in NX2 plasma focus for different applied voltage. Jurnal Teknologi, 78 (3-2). pp. 133-137. ISSN 0127-9696 https://www.scopus.com
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
language English
topic RM Therapeutics. Pharmacology
spellingShingle RM Therapeutics. Pharmacology
Nawi, N. D.
Ong, S. T.
Ali, J.
Chaudhary, K.
Bahadoran, M.
Daud, S.
Numerical studies of ion beam in NX2 plasma focus for different applied voltage
description Plasma focus device gives simultaneous interaction between magnetic and electric field which results in exhibiting multi-radiation properties. Ion beam radiates from the system is significant for experimenting target material of interest in plasma focus research. Lee code model is used to simulate the numerical experiments on NX2-plasma focus device system using different applied voltage in the range 10 to 14 kV. The system is operating in Neon filled at an optimum pressure depending on the applied voltage used in the experiment. Results obtained are analysed and fitted with the experimental results for system validation. Good fitting on the numerical with the experimental results is obtained by incorporating mass shedding effects and current shedding factor. The range of current density obtained is in the range 1.6 × 108 to 7.3×109 Am-2whilst the maximum ion beam energy is estimated to be 156 J.
format Article
author Nawi, N. D.
Ong, S. T.
Ali, J.
Chaudhary, K.
Bahadoran, M.
Daud, S.
author_facet Nawi, N. D.
Ong, S. T.
Ali, J.
Chaudhary, K.
Bahadoran, M.
Daud, S.
author_sort Nawi, N. D.
title Numerical studies of ion beam in NX2 plasma focus for different applied voltage
title_short Numerical studies of ion beam in NX2 plasma focus for different applied voltage
title_full Numerical studies of ion beam in NX2 plasma focus for different applied voltage
title_fullStr Numerical studies of ion beam in NX2 plasma focus for different applied voltage
title_full_unstemmed Numerical studies of ion beam in NX2 plasma focus for different applied voltage
title_sort numerical studies of ion beam in nx2 plasma focus for different applied voltage
publisher Penerbit UTM Press
publishDate 2016
url http://eprints.utm.my/id/eprint/70081/1/NinaDianaNawi2016_NumericalStudiesofIonBeamInNx2.pdf
http://eprints.utm.my/id/eprint/70081/
https://www.scopus.com
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