Precision permittivity measurement for low-loss thin planar materials using large coaxial probe from 1 to 400 MHz
This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Journal of Manufacturing and Materials Processing
2018
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/82316/1/YouKokYeow2018_Precisionpermittivitymeasurement.pdf http://eprints.utm.my/id/eprint/82316/ https://www.mdpi.com |
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| Institution: | Universiti Teknologi Malaysia |
| Language: | English |
| Summary: | This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three offset shorts. The reflection coefficient for the thin material is measured using a Keysight E5071C network analyzer from 0.3 MHz to 650 MHz and then converted to a relative dielectric constant and tangent loss via closed form capacitance model and lift-off calibration process. Measurement error of dielectric constant, Δεr is less than 2.5 % from 1 MHz to 400 MHz and the resolution of loss tangent, tan δ measurement is capable of achieving 3×10-3. |
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