Multiple controlled antirandom testing (MCAT) for high fault coverage in a black box environment

• Main Authors: Alamgir, Arbab, A’Ain, Abu Khari, Sheikh, Usman Ullah, Paraman, Norlina, Mohd. Mokji, Musa, Grout, Ian
• Format: Article
• Published: IEEE 2019
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/88454/; http://dx.doi.org/10.1109/ACCESS.2019.2937113
• Institution: Universiti Teknologi Malaysia

Among the black-box approaches to digital circuit testing, Random testing is popular due to its simplicity and cost effectiveness. Unfortunately, available evidences suggest that Random testing is equipped with a number of redundant patterns that increase test length without significantly raising th...