Using A Cropping Technique or Not: Impacts on SVM-based AMD Detection on OCT Images

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Bibliographic Details
Main Authors: Ko, C.-E., Chen, P.-H., Liao, W.-M., Lu, C.-K., Lin, C.-H., Liang, J.-W.
Format: Conference or Workshop Item
Published: Institute of Electrical and Electronics Engineers Inc. 2019
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85070449570&doi=10.1109%2fAICAS.2019.8771609&partnerID=40&md5=9fa13736e8774bf6e23cb3b527d65084
http://eprints.utp.edu.my/25096/
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Institution: Universiti Teknologi Petronas
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