Autoregressive Wiener filtering in a scanning electron microscopy imaging system

• Main Author: Kamel , Nidal
• Format: Citation Index Journal
• Published: Published by FAMS, Inc., Foundation for Advances in Medicine and Science at Mahwah, N.J., U.S.A. 2005
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utp.edu.my/4709/1/Scanning_4.PDF; http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1932-8745; http://eprints.utp.edu.my/4709/
• Institution: Universiti Teknologi Petronas

In this paper, we propose to use the autoregressive (AR)-based interpolator with Wiener filter and apply the idea to scanning electron microscope (SEM) images. The concept for combining the AR-based interpolator with Wiener filtering comes from the essential requirement of Wiener filtering for accur...