Dynamic Voltage Scaling Aware Delay Fault Testing

• Main Authors: Zain Ali, Noohul Basheer, Zwolinski, Mark, Al-Hashimi, Bashir M, Harrod, Peter
• Format: Conference or Workshop Item
• Published: 2006
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utp.edu.my/4817/1/Dynamic_Voltage_Scaling_Aware_Delay_Fault_Testing.pdf; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1628148; http://eprints.utp.edu.my/4817/
• Institution: Universiti Teknologi Petronas

The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS applic...