Applied scanning probe methods IX : characterization

436 p.

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Bibliographic Details
Other Authors: Bhushan, Bharat ; Fuchs, H. ; Tomitori, M.
Format: Book
Language:English
Published: Springer 2017
Subjects:
Online Access:http://repository.vnu.edu.vn/handle/VNU_123/24934
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Institution: Vietnam National University, Hanoi
Language: English
id oai:112.137.131.14:VNU_123-24934
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spelling oai:112.137.131.14:VNU_123-249342020-07-01T02:48:27Z Applied scanning probe methods IX : characterization Bhushan, Bharat ; Fuchs, H. ; Tomitori, M. Materials -- Microscopy Scanning probe microscopy -- Industrial applications 620.1 436 p. 2017-04-07T01:55:28Z 2017-04-07T01:55:28Z 2008 Book http://repository.vnu.edu.vn/handle/VNU_123/24934 en application/pdf Springer
institution Vietnam National University, Hanoi
building VNU Library & Information Center
country Vietnam
collection VNU Digital Repository
language English
topic Materials -- Microscopy
Scanning probe microscopy -- Industrial applications
620.1
spellingShingle Materials -- Microscopy
Scanning probe microscopy -- Industrial applications
620.1
Applied scanning probe methods IX : characterization
description 436 p.
author2 Bhushan, Bharat ; Fuchs, H. ; Tomitori, M.
author_facet Bhushan, Bharat ; Fuchs, H. ; Tomitori, M.
format Book
title Applied scanning probe methods IX : characterization
title_short Applied scanning probe methods IX : characterization
title_full Applied scanning probe methods IX : characterization
title_fullStr Applied scanning probe methods IX : characterization
title_full_unstemmed Applied scanning probe methods IX : characterization
title_sort applied scanning probe methods ix : characterization
publisher Springer
publishDate 2017
url http://repository.vnu.edu.vn/handle/VNU_123/24934
_version_ 1680968446328700928