Characterizing Stochastic Errors of MEMS – Based Inertial Sensors

p. 34-42

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Main Authors: Pham, Van Tang, Tran, Duc Tan, Chu, Duc Trinh
Format: Article
Language:English
Published: H. : ĐHQGHN 2017
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Online Access:http://repository.vnu.edu.vn/handle/VNU_123/55649
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Institution: Vietnam National University, Hanoi
Language: English
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spelling oai:112.137.131.14:VNU_123-556492017-09-30T21:23:47Z Characterizing Stochastic Errors of MEMS – Based Inertial Sensors Pham, Van Tang Tran, Duc Tan Chu, Duc Trinh Sensor MEMS Stochastic Errors p. 34-42 Thank to strong grow of MicroElectroMechanicalSystem (MEMS) technology, high performance and small size sensors are widely used in many areas such as landslide, navigation, mobile phones, etc. However, there are several kinds of errors are still existing in MEMS based sensors that need a carefully analyzing and calibration. By each year, the performances of commercial sensors are also improved. In this paper, we focused on characterizing the stochastic errors of accelerometers and gyroscopes integrated with a latest smart phone of Apple Inc. Iphone6+. The MP67B is a custom version of the InvenSense 6-Axis device (3-Axis gyroscope and 3-Axis accelerometer) made for Apple. This research will play an important step to decide whether we can create an Inertial Navigation System (INS) in the same device (i.e. the smart phone, the users do not need to equip a single device for positioning application). The Allan variance method is exploited to analyze the stochastic errors in these sensors. Experiments proved that the main sources of errors in these sensors are white noises. The Iphone5 can operate as a low-cost solution of positioning and navigation device. 2017-08-07T08:29:36Z 2017-08-07T08:29:36Z 2016 Article 2588-1124 http://repository.vnu.edu.vn/handle/VNU_123/55649 en Vol. 32;No 2 (2016) application/pdf H. : ĐHQGHN
institution Vietnam National University, Hanoi
building VNU Library & Information Center
country Vietnam
collection VNU Digital Repository
language English
topic Sensor
MEMS
Stochastic Errors
spellingShingle Sensor
MEMS
Stochastic Errors
Pham, Van Tang
Tran, Duc Tan
Chu, Duc Trinh
Characterizing Stochastic Errors of MEMS – Based Inertial Sensors
description p. 34-42
format Article
author Pham, Van Tang
Tran, Duc Tan
Chu, Duc Trinh
author_facet Pham, Van Tang
Tran, Duc Tan
Chu, Duc Trinh
author_sort Pham, Van Tang
title Characterizing Stochastic Errors of MEMS – Based Inertial Sensors
title_short Characterizing Stochastic Errors of MEMS – Based Inertial Sensors
title_full Characterizing Stochastic Errors of MEMS – Based Inertial Sensors
title_fullStr Characterizing Stochastic Errors of MEMS – Based Inertial Sensors
title_full_unstemmed Characterizing Stochastic Errors of MEMS – Based Inertial Sensors
title_sort characterizing stochastic errors of mems – based inertial sensors
publisher H. : ĐHQGHN
publishDate 2017
url http://repository.vnu.edu.vn/handle/VNU_123/55649
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