Study of effects of silver incorporation on electrical and optical properties of TCO thin films : Luận văn ThS. Công nghệ nano (Chuyên ngành đào tạo thí điểm)
Ag-augmented niobium-doped titanium oxide (TNO) and Ag-doped delafossite CuAlxOy thin films were deposited by co-sputtering techniques. The electrical properties were carried out on a 4-point prober. The optical properties were characterized on an UV-VIS spectrometer. The results of TNO thin film...
محفوظ في:
| المؤلف الرئيسي: | |
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| مؤلفون آخرون: | |
| التنسيق: | Theses and Dissertations |
| اللغة: | English |
| منشور في: |
2019
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://repository.vnu.edu.vn/handle/VNU_123/65760 |
| الوسوم: |
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| المؤسسة: | Vietnam National University, Hanoi |
| اللغة: | English |
| الملخص: | Ag-augmented niobium-doped titanium oxide (TNO) and Ag-doped delafossite
CuAlxOy thin films were deposited by co-sputtering techniques. The electrical
properties were carried out on a 4-point prober. The optical properties were
characterized on an UV-VIS spectrometer. The results of TNO thin films indicated
that when the Ag concentration increases the resistivity decreases from 2.6x
Ω.cm to 3.7x Ω.cm, accompagned with good optical transmittances, higher
than 60% in the visible range. The results on CuAlxOy doped Ag thin films showed
that CuAlxOy doped Ag they can be hardly applied for transparent conductive layers.
However, these films exhibited relatively high temperature coefficient of resistance
of about 3%/K, thus being suitable for applications in microbolometers. |
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