Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications

The energy storage potential of silver oxide (Ag2O) thin film electrodes, deposited via radio frequency reactive magnetron sputtering, was investigated in an ionic electrolyte (1-Ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide for supercapacitor applications. X-ray diffraction (XRD), Ram...

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Main Authors: Oje, Alex.I., Ogwu, A.A., Mirzaeian, Mojtaba, Tsendzughul, Nathaniel, Oje, A.M.
Format: Article
Language:English
Published: Elsevier 2019
Subjects:
BET
EIS
Online Access:http://repository.vnu.edu.vn/handle/VNU_123/67902
https://doi.org/10.1016/j.jsamd.2019.04.003
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Institution: Vietnam National University, Hanoi
Language: English
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spelling oai:112.137.131.14:VNU_123-679022019-10-21T02:43:11Z Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications Oje, Alex.I. Ogwu, A.A. Mirzaeian, Mojtaba Tsendzughul, Nathaniel Oje, A.M. Silver oxide BET EIS Cyclic voltammetry Pseudocapacitor The energy storage potential of silver oxide (Ag2O) thin film electrodes, deposited via radio frequency reactive magnetron sputtering, was investigated in an ionic electrolyte (1-Ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide for supercapacitor applications. X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and Fourier Transform infrared spectroscopy (FTIR) tools were used to evaluate the structural and oxide phases present in the sputtered silver oxide thin film electrodes. The growth mode, morphology, surface area, wettability and surface energy of the deposited nano-structure silver oxide thin films were confirmed by scanning electron microscope (SEM) data, the Brunauer-Emmett-Teller (BET) analysis and by goniometer and tensiometer studies. Furthermore, the ion diffusion, the Faradaic redox reactions and the capacitance of the sputtered thin films exposed to 1-Ethyl- 3-methylimidazolium bis(trifluoromethylsulfonyl)imide ionic electrolyte, were monitored with electrochemical impedance spectroscopy (EIS) and cyclic voltammetry (CV). The SEM micrographs depict that silver oxide thin films exhibit a columnar growth mode. The wettability analysis reveals that Ag2O thin films are hydrophilic, an indication for excellent electrochemical behaviour. Cyclic voltammetry measurements show that Ag2O thin films exhibit a specific capacitance of 650 F/g at higher sputtering power ,demonstrating its promising potential as an active electrode for supercapacitor applications 2019-10-21T02:43:11Z 2019-10-21T02:43:11Z 2019 Article Oje, A. I., et al. (2019). Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications. Journal of Science: Advanced Materials and Devices 4 (2019) 213-222 2468-2179 http://repository.vnu.edu.vn/handle/VNU_123/67902 https://doi.org/10.1016/j.jsamd.2019.04.003 en Journal of Science: Advanced Materials and Devices; application/pdf Elsevier
institution Vietnam National University, Hanoi
building VNU Library & Information Center
country Vietnam
collection VNU Digital Repository
language English
topic Silver oxide
BET
EIS
Cyclic voltammetry
Pseudocapacitor
spellingShingle Silver oxide
BET
EIS
Cyclic voltammetry
Pseudocapacitor
Oje, Alex.I.
Ogwu, A.A.
Mirzaeian, Mojtaba
Tsendzughul, Nathaniel
Oje, A.M.
Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
description The energy storage potential of silver oxide (Ag2O) thin film electrodes, deposited via radio frequency reactive magnetron sputtering, was investigated in an ionic electrolyte (1-Ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide for supercapacitor applications. X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and Fourier Transform infrared spectroscopy (FTIR) tools were used to evaluate the structural and oxide phases present in the sputtered silver oxide thin film electrodes. The growth mode, morphology, surface area, wettability and surface energy of the deposited nano-structure silver oxide thin films were confirmed by scanning electron microscope (SEM) data, the Brunauer-Emmett-Teller (BET) analysis and by goniometer and tensiometer studies. Furthermore, the ion diffusion, the Faradaic redox reactions and the capacitance of the sputtered thin films exposed to 1-Ethyl- 3-methylimidazolium bis(trifluoromethylsulfonyl)imide ionic electrolyte, were monitored with electrochemical impedance spectroscopy (EIS) and cyclic voltammetry (CV). The SEM micrographs depict that silver oxide thin films exhibit a columnar growth mode. The wettability analysis reveals that Ag2O thin films are hydrophilic, an indication for excellent electrochemical behaviour. Cyclic voltammetry measurements show that Ag2O thin films exhibit a specific capacitance of 650 F/g at higher sputtering power ,demonstrating its promising potential as an active electrode for supercapacitor applications
format Article
author Oje, Alex.I.
Ogwu, A.A.
Mirzaeian, Mojtaba
Tsendzughul, Nathaniel
Oje, A.M.
author_facet Oje, Alex.I.
Ogwu, A.A.
Mirzaeian, Mojtaba
Tsendzughul, Nathaniel
Oje, A.M.
author_sort Oje, Alex.I.
title Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
title_short Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
title_full Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
title_fullStr Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
title_full_unstemmed Pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
title_sort pseudo-capacitance of silver oxide thin film electrodes in ionic liquid for electrochemical energy applications
publisher Elsevier
publishDate 2019
url http://repository.vnu.edu.vn/handle/VNU_123/67902
https://doi.org/10.1016/j.jsamd.2019.04.003
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