Effect of annealing temperature on Cu2O thin films prepared by thermal oxidation method

We report a facile process to fabricate cuprous thin films by thermal oxidation of copper substrates. Structure and phase identification were studied by X-ray diffraction measurement and Raman spectroscopy. Scanning electron microscopy was utilized to study surface morphology of the as-fabricated th...

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Main Authors: Tran, Thi Ha, Nguyen, Thi Huyen Trang, Bach, Thanh Cong, Nguyen, Thi Dieu Thu, Nguyen, Thanh Binh, Nguyen, Viet Tuyen, Pham, Nguyen Hai
格式: Article
語言:English
出版: H. : ĐHQGHN 2020
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在線閱讀:http://repository.vnu.edu.vn/handle/VNU_123/89115
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