8088 support chip tester
Troubleshooting tools provide both convenience and confidence when debugging personal computers or other digital electronic systems. One such tool is the TTL IC tester. But this is limited to checking TTL devices only, such as the 54/74TTL series chips. Thus, the need for a debugging tool that can c...
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| Main Authors: | , , , |
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| Format: | text |
| Language: | English |
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Animo Repository
1992
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| Subjects: | |
| Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/16386 |
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| Institution: | De La Salle University |
| Language: | English |
| Summary: | Troubleshooting tools provide both convenience and confidence when debugging personal computers or other digital electronic systems. One such tool is the TTL IC tester. But this is limited to checking TTL devices only, such as the 54/74TTL series chips. Thus, the need for a debugging tool that can check special purpose devices supporting the 8088 microprocessor was seen. The study addresses the problem of designing a device that will check the functionality of the following 8088 support chips: 1) 8237A Programmable DMA Controller. 2) 8253 Programmable Interval Timer. 3) 8255A Programmable Peripheral Interface. 4) 8259A Programmable Interrupt Controller. 5) 8284A Clock Generator and Drivers. 6) 8288 Bus Controller. Before the actual development of the device, research regarding the functional descriptions and configurations of the support chips was first conducted. This research was aimed at finding how to test the peripherals. Research was followed by the actual designing of the tester on a modular basis, which was later merged to form three circuit boards, each board having two tester modules. Testing is done by sending simulated data and control inputs to the chips and reading their corresponding outputs. Any discrepancy with the expected output means that the chip being tested is malfunctioning. All support devices are tested the way they are configured in a PC/XT and are checked in an almost extensive manner, using all possible input combinations in all possible configurations. The support chips are also tested with increasing temperature and varying VCC values. |
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