Methodological preparation and crystal structure characterization of C thin films through initial investigative experimentation

• Main Author: Galian, Richard Anthony F.
• Format: text
• Language: English
• Published: Animo Repository 1997
• Subjects: Thin films; Crystals; Superconductivity; Crystallography; X-rays > Diffraction; Carbon
• Online Access: https://animorepository.dlsu.edu.ph/etd_bachelors/1408
• Institution: De La Salle University

Thin films of the new allotropic form of carbon, Buckminsterfullerene (C60) were deposited on glass substrate via high vacuum deposition by simulating a hot-wall epitaxial system. Starting material was C60 powder purchased from Sigma with a purity of unknown percentage. Preliminary tests were done on the starting material to verify the chemical used. FTIR shows the expected four strong peaks of 1428.92, 1198.75, 580.53, and 522.25 cm. DTA results were congruent with phase change speculations based on works by Zhennan et al, Haufler et. al, and so on. The hot wall epitaxial system yielded thin films of 4-10A of questionable thickness due to instrumentation problems with the profilometer. As an alternative, qualitative comparison via photography was implemented to differentiate sample thickness. The XRD patterns of the thin films showed that they wee crystalline C60. It also verifies the hep lattice formation when deposited onto a glass substrate.