An Investigation on the transport properties of spin coated redox-active nafion® thin films using cyclic voltammetry
Redox-active hexaammineruthenium(III) [Ru(NH3)6]3+ incorporated Nafion® thin films (nm) were fabricated using spin-coating technique on indium tin oxide (ITO) coated glass substrate. The deposition of the films onto the substrates was verified using energy dispersive x-ray (EDX), surface morphology...
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| Format: | text |
| Language: | English |
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Animo Repository
2012
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| Online Access: | https://animorepository.dlsu.edu.ph/etd_bachelors/2550 |
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| Institution: | De La Salle University |
| Language: | English |
| Summary: | Redox-active hexaammineruthenium(III) [Ru(NH3)6]3+ incorporated Nafion® thin films (nm) were fabricated using spin-coating technique on indium tin oxide (ITO) coated glass substrate. The deposition of the films onto the substrates was verified using energy dispersive x-ray (EDX), surface morphology characterized using scanning electron microscopy (SEM), and electrochemical characteristic through cyclic voltammetry. The concentration of the ruthenium complex, and thinning rate were chosen as the parameters for the study. EDX results confirm the presence of the films on the substrate. Surface morphological results determine that the film is smooth at 10,000x magnification but exhibit lumps at high concentrations but were smoothened out at increasing thinning rates. Voltammetry results show that peak currents decrease at increasing thinning rates and at decreasing concentrations. Moreover, the diffusion coefficients decrease at increasing concentration and decrease at increasing thinning rates. Calculated values of the diffusion coefficients indicate that the ruthenium complex is immobilized in the film. |
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