An expert system for semiconductor device assembly diagnostics

High volume manufacturing (HVM) is the motivation of this study. HVM is made possible by robust system of automation and manufacturing technology. However, there are vulnerabilities that may be catastrophic. One of the major vulnerabilities is the process and equipment problem. The problem can be ca...

Full description

Saved in:
Bibliographic Details
Main Author: Co, Celso B.
Format: text
Language:English
Published: Animo Repository 2007
Subjects:
Online Access:https://animorepository.dlsu.edu.ph/etd_doctoral/142
https://animorepository.dlsu.edu.ph/context/etd_doctoral/article/1141/viewcontent/CDTG004147_P__2_.pdf
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: De La Salle University
Language: English
id oai:animorepository.dlsu.edu.ph:etd_doctoral-1141
record_format eprints
spelling oai:animorepository.dlsu.edu.ph:etd_doctoral-11412022-06-09T04:02:25Z An expert system for semiconductor device assembly diagnostics Co, Celso B. High volume manufacturing (HVM) is the motivation of this study. HVM is made possible by robust system of automation and manufacturing technology. However, there are vulnerabilities that may be catastrophic. One of the major vulnerabilities is the process and equipment problem. The problem can be categorized as either recurrent or new ones. The recurrent problems have well-defined structured solutions and they constitute the majority of the problems. The new ones ha ve no solution and require mobilization of extra resources to investigate and resolve them. The new ones may not be the topmost concern since experience indicates it seldom occurs or it occurs only a couple of times in a year. Real problems are recurrent problems that are mistaken as new ones and their solutions are repeatedly rediscovered after agonizing trial and error and wasted production time. Expert system is proposed as solution for repeatedly occurring problems and its must be developed to quickly assist human in diagnostic activity. Expert system must be structured to deliver the correct solutions and must be unstructured to deal with human inputs and to establish priority of actions for human to execute. Area of investigation will be diagnostic tree and set theory application and the scope of study are defined within process, equipment, and continuous improvement diagnostics. Expert system is proposed as solution for repeatedly occurring problems and its must be developed to quickly assist human in diagnostic activity. Expert system must be structured to deliver the correct solutions and must be unstructured to deal with human inputs and to establish priority of actions for human to execute. Area of investigation will be diagnostic tree and set theory application and the scope of study are defined within process, equipment, and continuous improvement diagnostics. The benefit is cost effective troubleshooting operation by using first expert system before going to resource mobilization. Only truly new problem is referred to resource mobilization. 2007-01-01T08:00:00Z text application/pdf https://animorepository.dlsu.edu.ph/etd_doctoral/142 https://animorepository.dlsu.edu.ph/context/etd_doctoral/article/1141/viewcontent/CDTG004147_P__2_.pdf Dissertations English Animo Repository Semiconductors Expert systems (Computer science) Artificial intelligence Engineering
institution De La Salle University
building De La Salle University Library
continent Asia
country Philippines
Philippines
content_provider De La Salle University Library
collection DLSU Institutional Repository
language English
topic Semiconductors
Expert systems (Computer science)
Artificial intelligence
Engineering
spellingShingle Semiconductors
Expert systems (Computer science)
Artificial intelligence
Engineering
Co, Celso B.
An expert system for semiconductor device assembly diagnostics
description High volume manufacturing (HVM) is the motivation of this study. HVM is made possible by robust system of automation and manufacturing technology. However, there are vulnerabilities that may be catastrophic. One of the major vulnerabilities is the process and equipment problem. The problem can be categorized as either recurrent or new ones. The recurrent problems have well-defined structured solutions and they constitute the majority of the problems. The new ones ha ve no solution and require mobilization of extra resources to investigate and resolve them. The new ones may not be the topmost concern since experience indicates it seldom occurs or it occurs only a couple of times in a year. Real problems are recurrent problems that are mistaken as new ones and their solutions are repeatedly rediscovered after agonizing trial and error and wasted production time. Expert system is proposed as solution for repeatedly occurring problems and its must be developed to quickly assist human in diagnostic activity. Expert system must be structured to deliver the correct solutions and must be unstructured to deal with human inputs and to establish priority of actions for human to execute. Area of investigation will be diagnostic tree and set theory application and the scope of study are defined within process, equipment, and continuous improvement diagnostics. Expert system is proposed as solution for repeatedly occurring problems and its must be developed to quickly assist human in diagnostic activity. Expert system must be structured to deliver the correct solutions and must be unstructured to deal with human inputs and to establish priority of actions for human to execute. Area of investigation will be diagnostic tree and set theory application and the scope of study are defined within process, equipment, and continuous improvement diagnostics. The benefit is cost effective troubleshooting operation by using first expert system before going to resource mobilization. Only truly new problem is referred to resource mobilization.
format text
author Co, Celso B.
author_facet Co, Celso B.
author_sort Co, Celso B.
title An expert system for semiconductor device assembly diagnostics
title_short An expert system for semiconductor device assembly diagnostics
title_full An expert system for semiconductor device assembly diagnostics
title_fullStr An expert system for semiconductor device assembly diagnostics
title_full_unstemmed An expert system for semiconductor device assembly diagnostics
title_sort expert system for semiconductor device assembly diagnostics
publisher Animo Repository
publishDate 2007
url https://animorepository.dlsu.edu.ph/etd_doctoral/142
https://animorepository.dlsu.edu.ph/context/etd_doctoral/article/1141/viewcontent/CDTG004147_P__2_.pdf
_version_ 1778174146154332160