An expert system for semiconductor device assembly diagnostics

High volume manufacturing (HVM) is the motivation of this study. HVM is made possible by robust system of automation and manufacturing technology. However, there are vulnerabilities that may be catastrophic. One of the major vulnerabilities is the process and equipment problem. The problem can be ca...

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主要作者: Co, Celso B.
格式: text
語言:English
出版: Animo Repository 2007
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在線閱讀:https://animorepository.dlsu.edu.ph/etd_doctoral/142
https://animorepository.dlsu.edu.ph/context/etd_doctoral/article/1141/viewcontent/CDTG004147_P__2_.pdf
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機構: De La Salle University
語言: English