A heuristic approach in the characterization of JFET functionality

The process flow and the recipes for production used in the fabrication of integrated circuit devices are always adjusted depending on the type of device one wants to produce. The whole process requires extensive characterization activities to match the different fabrication process parameters with...

Full description

Saved in:
Bibliographic Details
Main Author: Lim, Felix Chan
Format: text
Language:English
Published: Animo Repository 2003
Subjects:
Online Access:https://animorepository.dlsu.edu.ph/etd_doctoral/918
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: De La Salle University
Language: English
Be the first to leave a comment!
You must be logged in first