Potential map of GMR head triboelectric charging during lapping

• Main Authors: Pobre, Romeric F., Bornilla, Ermys B., Esmeria, Jose M., Jr.
• Format: text
• Published: Animo Repository 2003
• Subjects: Electric charge and distribution; Magnetoresistance; Physical Sciences and Mathematics; Physics
• Online Access: https://animorepository.dlsu.edu.ph/faculty_research/11333
• Institution: De La Salle University

A computational model to characterize the dynamics of triboelectric charging on GMR heads during a lapping process is considered. Various diamond embedment configurations in slurry are presented to assess the electrostatic discharge (ESD) damage on GMR heads. Dilution ratio of slurry, slurry concentration, density of diluted slurry, density of abrasive slurry, density of wafer, area of wafer, average size of grit, hardness of GMR head, hardness of lapping plate, ratio of real contact, relative velocity of GMR head, height of asperities, area of asperities, density of asperity grid, radius of asperity tip, standard deviation of abrasive size, and Young's modulus of lapping plate are specified to simulate the amount of accumulated triboelectric charge on GMR heads during a lapping process. We believe this is the first numerical work on the investigation of triboelectric ESD damage on GMR heads due to a lapping process.