Technical report complaint: Philips report number: JKR-20-04-8DC0059

• Main Authors: Fio, Julius, Llagas, Roed, Juanillo, Art, Antonio, Addo, Decena, Roel, Montemayo, Bernie, Galit, Emil, Macario, Billy, Carrasco, Chris, Aquino, Delia, Mendoza, Nonoy, Macarubbo, Roehl M.
• Format: text
• Published: Animo Repository 2004
• Subjects: Failure analysis (Engineering); Manufactures—Defects; Semiconductors—Defects; Operations Research, Systems Engineering and Industrial Engineering
• Online Access: https://animorepository.dlsu.edu.ph/faculty_research/8334
• Institution: De La Salle University