A morphological and cyclic voltammetric investigation of spin-coated hexaammineruthernium (III)-incorporated Nafion® thin films
Hexaammineruthenium(III)-incorporated Nafion® thin films (< /600nm) were fabricated using dynamic dispense spin coating. The concentration of the ruthenium complex and the thinning rates were varied and compared. Scanning electron microscopy was used to investigate the surface morphology of the s...
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| Main Authors: | , , |
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| Format: | text |
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Animo Repository
2014
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| Online Access: | https://animorepository.dlsu.edu.ph/faculty_research/11675 |
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| Institution: | De La Salle University |
| Summary: | Hexaammineruthenium(III)-incorporated Nafion® thin films (< /600nm) were fabricated using dynamic dispense spin coating. The concentration of the ruthenium complex and the thinning rates were varied and compared. Scanning electron microscopy was used to investigate the surface morphology of the spin-coated thin films and cyclic voltammetry (CV) for the transport properties. Micrographs showed the presence of lumps on the most concentrated film, but were better smoothened with increased thinning rates and vanished with decreased concentration, and that the surface appeared to be smooth. CV characterizations showed that concentrations played a greater role in the conductivity of the film resulting from the concentration of the redox mediator content which indicated that thinner films, therefore, were either more efficient or more sensitive. The test also indicated that the ruthenium complex was immobilized in the Nafion film. |
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