Detection of Nitrogen in Layer-by-Layer Polymeric Films by Energy Dispersive X-Ray Spectroscopy

Detection of Nitrogen in Layer-by-Layer Polymeric Films by Energy Dispersive X-Ray Spectroscopy

Scanning electron microscopy - energy dispersive X-ray spectrometry (SEM-EDS) is an elemental analysis technique widely used in various fields to identify any element in the periodic table except H, He and Li. It can be a quick way to assess the response of sensing films before deposition on sensing...

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Bibliographic Details
Main Authors: Castillo, Virgil Christian, Limpoco, Ted, Enriquez, Erwin
Format: text
Published: Archīum Ateneo 2022
Subjects:
EDS
Elemental analysis
Energy dispersive X-ray spectroscopy
Nitrogen analysis
Scanning electron microscopy
SEM
Thin film analysis
Chemical Engineering
Chemistry
Engineering
Materials Chemistry
Physical Sciences and Mathematics
Online Access:https://archium.ateneo.edu/chemistry-faculty-pubs/192
https://www.scientific.net/KEM.913.87
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Institution: Ateneo De Manila University

Internet

https://archium.ateneo.edu/chemistry-faculty-pubs/192
https://www.scientific.net/KEM.913.87

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