Highly Reliable Memory Architecture Using Adaptive Combination of Proactive Aging-aware In-Field Self- Repair and ECC

• Main Authors: Mayuga, Gian, Sato, Yasuo, Inoue, Michiko
• 格式: text
• 出版: Archīum Ateneo 2019
• 主題: memory reliability; aging-aware; proactive reconfiguration; memory repair; in-field test and repair; ECC; Electrical and Computer Engineering
• 在線閱讀: https://archium.ateneo.edu/ecce-faculty-pubs/26; https://ieeexplore.ieee.org/abstract/document/8747431

Reliability of embedded memory is critical for SoCs. Aging-induced faults manifest in field, and they affect the reliability of embedded memories which occupy the most area of a SoC. By performing a proactive approach that repairs aged memory words in use, the probability of fault occurrence should...