Discriminative deep metric learning for face verification in the wild

• Main Authors: Hu, Junlin, Lu, Jiwen, Tan, Yap Peng
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2015
• Subjects: DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
• Online Access: https://hdl.handle.net/10356/100336; http://hdl.handle.net/10220/25706
• Institution: Nanyang Technological University

This paper presents a new discriminative deep metric learning (DDML) method for face verification in the wild. Different from existing metric learning-based face verification methods which aim to learn a Mahalanobis distance metric to maximize the inter-class variations and minimize the intra-c...