Discriminative deep metric learning for face verification in the wild

• Main Authors: Hu, Junlin, Lu, Jiwen, Tan, Yap Peng
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2015
• 主題: DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
• 在線閱讀: https://hdl.handle.net/10356/100336; http://hdl.handle.net/10220/25706

This paper presents a new discriminative deep metric learning (DDML) method for face verification in the wild. Different from existing metric learning-based face verification methods which aim to learn a Mahalanobis distance metric to maximize the inter-class variations and minimize the intra-c...