Quantifying statistical interdependence, part III : N > 2 point processes

Stochastic event synchrony (SES) is a recently proposed family of similarity measures. First, “events” are extracted from the given signals; next, one tries to align events across the different time series. The better the alignment, the more similar the N time series are considered to be. The simila...

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Main Authors: Dauwels, Justin, Weber, Theophane, Vialatte, François-Benoît, Musha, Toshimitsu, Cichocki, Andrzej
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2013
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Online Access:https://hdl.handle.net/10356/100917
http://hdl.handle.net/10220/11047
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-1009172020-03-07T14:00:32Z Quantifying statistical interdependence, part III : N > 2 point processes Dauwels, Justin Weber, Theophane Vialatte, François-Benoît Musha, Toshimitsu Cichocki, Andrzej School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering Stochastic event synchrony (SES) is a recently proposed family of similarity measures. First, “events” are extracted from the given signals; next, one tries to align events across the different time series. The better the alignment, the more similar the N time series are considered to be. The similarity measures quantify the reliability of the events (the fraction of “nonaligned” events) and the timing precision. So far, SES has been developed for pairs of one-dimensional (Part I) and multidimensional (Part II) point processes. In this letter (Part III), SES is extended from pairs of signals to N > 2 signals. The alignment and SES parameters are again determined through statistical inference, more specifically, by alternating two steps: (1) estimating the SES parameters from a given alignment and (2), with the resulting estimates, refining the alignment. The SES parameters are computed by maximum a posteriori (MAP) estimation (step 1), in analogy to the pairwise case. The alignment (step 2) is solved by linear integer programming. In order to test the robustness and reliability of the proposed N-variate SES method, it is first applied to synthetic data. We show that N-variate SES results in more reliable estimates than bivariate SES. Next N-variate SES is applied to two problems in neuroscience: to quantify the firing reliability of Morris-Lecar neurons and to detect anomalies in EEG synchrony of patients with mild cognitive impairment. Those problems were also considered in Parts I and II, respectively. In both cases, the N-variate SES approach yields a more detailed analysis. Published version 2013-07-09T03:22:23Z 2019-12-06T20:30:40Z 2013-07-09T03:22:23Z 2019-12-06T20:30:40Z 2011 2011 Journal Article Dauwels, J., Weber, T., Vialatte, F., Musha, T., & Cichocki, A. (2012). Quantifying Statistical Interdependence, Part III: N > 2 Point Processes. Neural Computation, 24(2), 408-454. 0899-7667 https://hdl.handle.net/10356/100917 http://hdl.handle.net/10220/11047 10.1162/NECO_a_00235 en Neural computation © 2011 Massachusetts Institute of Technology. This paper was published in Neural Computation and is made available as an electronic reprint (preprint) with permission of Massachusetts Institute of Technology. The paper can be found at the following official DOI: [http://dx.doi.org/10.1162/NECO_a_00235]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Dauwels, Justin
Weber, Theophane
Vialatte, François-Benoît
Musha, Toshimitsu
Cichocki, Andrzej
Quantifying statistical interdependence, part III : N > 2 point processes
description Stochastic event synchrony (SES) is a recently proposed family of similarity measures. First, “events” are extracted from the given signals; next, one tries to align events across the different time series. The better the alignment, the more similar the N time series are considered to be. The similarity measures quantify the reliability of the events (the fraction of “nonaligned” events) and the timing precision. So far, SES has been developed for pairs of one-dimensional (Part I) and multidimensional (Part II) point processes. In this letter (Part III), SES is extended from pairs of signals to N > 2 signals. The alignment and SES parameters are again determined through statistical inference, more specifically, by alternating two steps: (1) estimating the SES parameters from a given alignment and (2), with the resulting estimates, refining the alignment. The SES parameters are computed by maximum a posteriori (MAP) estimation (step 1), in analogy to the pairwise case. The alignment (step 2) is solved by linear integer programming. In order to test the robustness and reliability of the proposed N-variate SES method, it is first applied to synthetic data. We show that N-variate SES results in more reliable estimates than bivariate SES. Next N-variate SES is applied to two problems in neuroscience: to quantify the firing reliability of Morris-Lecar neurons and to detect anomalies in EEG synchrony of patients with mild cognitive impairment. Those problems were also considered in Parts I and II, respectively. In both cases, the N-variate SES approach yields a more detailed analysis.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Dauwels, Justin
Weber, Theophane
Vialatte, François-Benoît
Musha, Toshimitsu
Cichocki, Andrzej
format Article
author Dauwels, Justin
Weber, Theophane
Vialatte, François-Benoît
Musha, Toshimitsu
Cichocki, Andrzej
author_sort Dauwels, Justin
title Quantifying statistical interdependence, part III : N > 2 point processes
title_short Quantifying statistical interdependence, part III : N > 2 point processes
title_full Quantifying statistical interdependence, part III : N > 2 point processes
title_fullStr Quantifying statistical interdependence, part III : N > 2 point processes
title_full_unstemmed Quantifying statistical interdependence, part III : N > 2 point processes
title_sort quantifying statistical interdependence, part iii : n > 2 point processes
publishDate 2013
url https://hdl.handle.net/10356/100917
http://hdl.handle.net/10220/11047
_version_ 1681034918335873024