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Raghavan, Nagarajan, Andrea Padovani, Xiang Li, Michel Bosman, Xing Wu, Vui Lip Lo, Luca Larcher, Kin Leong Pey, و School of Electrical and Electronic Engineering. Resilience of Ultra-thin Oxynitride Films to Percolative Wear-out and Reliability Implications for High-κ Stacks At Low Voltage Stress. 2013.

Raghavan, Nagarajan, et al. Resilience of Ultra-thin Oxynitride Films to Percolative Wear-out and Reliability Implications for High-κ Stacks At Low Voltage Stress. 2013.