Sequence covering arrays
Sequential processes can encounter faults as a result of improper ordering of subsets of the events. In order to reveal faults caused by the relative ordering of t or fewer of v events, for some fixed t, a test suite must provide tests so that every ordering of every set of t or fewer events is ex...
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Main Authors: | Colbourn, Charles J., Chee, Yeow Meng, Horsley, Daniel, Zhou, Junling |
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Other Authors: | School of Physical and Mathematical Sciences |
Format: | Article |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/101415 http://hdl.handle.net/10220/18653 |
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Institution: | Nanyang Technological University |
Language: | English |
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